Signal to Noise Calculator + COSMOS
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PIXIS:1340 x 100F TE cooled
PIXIS:1340 x 100B-eXcelon TE cooled
PIXIS:1340 x 100BR-eXcelon TE cooled
PIXIS:1340 x 400F TE cooled
PIXIS:1340 x 400B-eXcelon TE cooled
PIXIS:1340 x 400BR TE cooled
PIXIS:2K 2048 x 512TE cooled
PIXIS:1300 1340 x 1300 TE cooled
PIXIS:256E 1024 x 256 TE cooled
PIXIS:256BR 1024 x 252 TE cooled
PIXIS:1024BUV 1024 x 1024 TE cooled
PIXIS:1024BR 1024 x 1024 TE cooled
BLAZE:100HR TE cooled
BLAZE:400HR TE cooled
BLAZE:100LD TE cooled
BLAZE:400LD TE cooled
SOPHIA:2048B-152 TE cooled
SOPHIA:2048B-132 TE cooled
SOPHIA:4096B-154 TE cooled
ProEM+:1600-200 TE cooled - EMCCD
ProEM+:1600-400 TE cooled - EMCCD
ProEM HS:512BX3 TE cooled - EMCCD
ProEM HS:1024BX3 TE cooled - EMCCD
PyLoN:100 LN Cooled
PyLoN:400 LN Cooled
PyLoN:1300 LN Cooled
PyLoN:2K LN Cooled
PyLoN:2048 LN Cooled
COSMOS-10 TE cooled
COSMOS-42 TE cooled
COSMOS-66 TE cooled
NIRvana 640 TE cooled
NIRvana HS TE cooled
NIRvana 640 LN cooled
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Show Chip size:
QE %
Exposure time,s
Pixels
High Sensitivity
High Capacity
Chip area mm
Gain 3
Gain 2
Gain 1
Pixel size µm
100 KHz
2 MHz
1 MHz
4 MHz
8 MHz
Single Pixel area µm
2
1 x 1
2 x 2
4 x 4
Single pixel Dynamic Range
Well capacity ke-
Signal e-/eff.pixel
Sensor temp C°-
S/N Ratio
Dark current e-/pixel/s
System gain e-/count
Readnoise e- rms
Expected counts*
Spherical photon flux
ph/s
Incident photons,ph/eff.pixel/s
Amplifier mode
: Optimization of system performance for lowest noise or highest SNR.
Binning factor:
The number of pixels to be combined.
Dark current:
The charge accumulated within a well, in the absence of light.
Exposure time:
The length of time that a CCD/COSMOS is accumulating charge.
Read noise:
Unwanted signal or disturbance that is generated by the on-chip amplifier
Signal-to-noise ratio:
The ratio of the measured signal to the overall noise at that pixel.
Dynamic Range:
Defined as the linear full well (e-) divided by read noise (e-).
Spherical photon flux:
The number of photons intercepted by a sphere per unit time.
System gain:
Relationship between the detected electrons and A/D units generated
E
xcess noise:
Statistical nature of the EMCCDs results in excess noise between 1 to 1,4.
EM gain
: Electrons are accelerated from pixel to pixel in the multiplication register.
HDR:
Utilizes dual conversion gain to increase Full Well Capacity at ultra-low noise.
CMS:
Correlated Multiple Sampling, a effective noise reduction technique.
Note: * The actual values may be 50-100 counts higher because of the Baseline Offset.
Disclaimer:
all numbers presented in this calculator should be used purely for reference and comparison purposes only. We do not assume any liability for their accuracy.